A modelling system has been developed to synthesize seismic reflection profiles. Interfaces may be of arbitrary shape. The source and receiver characteristics, free-surface reflection, geometric spreading, reflection and refraction, and absorption are used with the basic ray-tracing system for amplitude calculations. The limitations of the system are the restrictions to normal incidence reflections and two dimensions, and the inability to model processed profiles or diffractions.
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Steven M. Smith (1977) studied this question.
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