Views Icon Views Article contents Figures & tables Video Audio Supplementary Data Peer Review Share Icon Share Twitter Facebook Reddit LinkedIn Tools Icon Tools Reprints and Permissions Cite Icon Cite Search Site Citation Harry M. Bendler; The Observation of Stacking Faults in Silicon by Transmission Electron Microscopy. Journal of Applied Physics 1 January 1962; 33 (1): 240–241. https://doi.org/10.1063/1.1728508 Download citation file: Ris (Zotero) Reference Manager EasyBib Bookends Mendeley Papers EndNote RefWorks BibTex toolbar search Search Dropdown Menu toolbar search search input Search input auto suggest filter your search All ContentAIP Publishing PortfolioJournal of Applied Physics Search Advanced Search |Citation Search
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Harry Morrison Bendler (1962) studied this question.
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