A unified approach for radiative losses and backscattering in optical waveguides

Sidewall roughness in optical waveguides represents a severe impairment for the proper functionality of photonic integrated circuits. The interaction between the propagating mode and the roughness is responsible for both radiative losses and distributed backscattering. In this paper, a unified vision on these extrinsic loss phenomena is discussed, highlighting the fundamental role played by the sensitivity of the effective index n eff of the optical mode to waveguide width variations. The n w model presented applies to both 2D slab waveguides and 3D laterally confined waveguides and is in very good agreement with existing models that individually describe radiative loss or backscattering only. Experimental results are presented, demonstrating the validity of the n w model for arbitrary waveguide geometries and technologies. This approach enables an accurate description of realistic optical waveguides and provides simple design rules for optimization of the waveguide geometry in order to reduce the propagation losses generated by sidewall roughness.