On generation recombination and trapping kinetics in theories of small-signal electrical response

It is shown that small-signal electrical response results obtained for generation-recombination or trapping rate laws appropriate to a neutral-center dissociation-association mechanism encompasses the electrical response to be expected for other frequently encountered generation-recombination or trapping rate laws under a wide range of conditions. The rate constants appearing in such kinetic expressions are related to a number of differently defined charge-carrier lifetimes employed in the semiconductor and electrochemical literature. The ranges of charge-carrier lifetime characteristic of semiconductors, defect solid ionic conductors, and electrolyte solutions are briefly discussed.