A new confocal scanning‐stage transmit‐ted‐light and reflected‐light laser microscope is described. In addition to allowing confocal transmitted‐light imaging, this microscope has the unique feature of imaging both the top and bottom of a specimen in reflected light, with the two images in perfect registration. Only one detector is used; different imaging modes can be selected by simple rotation of the polarizers. Several confocal images are presented, chosen to illustrate the unique features of the instrument.
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Dixon et al. (1991) studied this question.
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