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GaN는 대표적인 III-V족 질화물반도체로 주로 값싸고 다루기 쉬운 사파이어 기판 위에 성장된다. 하지만 사파이어 기판은 부도체이며, GaN과의 격자부정합을 일으키고 열전도도 또한 낮은 기판으로 알려져 있다. 본 논문에서는 방열기능과 열 전기전도도가 뛰어난 금속 화합물 탄소체 기판 위에 poly GaN epilayer를 HVPE법으로 성장시켜보았다. 비정질의 금속 화합물 탄소체 기판위에 성장되는 GaN epilayer의 성장메카니즘을 관찰하였다. GaN epilayer의 성장을 위해 HCl과 NH₃ 를 흘려주었다. 성장하기 위해 source zone과 growth zone의 온도는 각각 850∘C 와 1090∘C 로 설정했다. 성장이 끝난 샘플은 SEM, EDS, XRD측정을 통해 분석하였다. The GaN layer was typical III-V nitride semiconductor and was grown on the sapphire substrate which cheap and convenient. However, sapphire substrate is non-conductivity, low thermal conductivity and has large lattice mismatch with the GaN layer. In this paper, the poly GaN epilayer was grown by HVPE on the metallic compound graphite substrate with good heat dissipation, high thermal and electrical conductivity. We tried to observe the growth mechanism of the GaN epilayer grown on the amorphous metallic compound graphite substrate. The HCl and NH₃ gas were flowed to grow the GaN epilayer. The temperature of source zone and growth zone in the HVPE system was set at 850∘C and 1090∘C , respectively. The GaN epilayer grown on the metallic compound graphite substrate was observed by SEM, EDS, XRD measurement.
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Kim et al. (2013) studied this question.
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