A fast scanning tunneling microscope (FSTM) is developed using a new method of compensating for the probe tip servo error in constant current mode. The compensation value is derived from the ratio of tunnel current fluctuation to tunnel current (ΔI/I) in a differential tunnel current equation. Dynamic video images of Si(111) adatomic structures taken using the FSTM prove that this method is effective for fast scanning.
No takes yet. Share an insight, caveat, or question.
Hosaka et al. (1990) studied this question.
Synapse has enriched 5 related papers. Consider them for comparative context: