A range of CoCrPt thin film discs sputtered on CrV underlayers have been prepared under varying base pressures. A general improvement in H/sub c/, squareness S* and recording performance determined by the media SNR was seen when the base pressure was reduced. Electron diffraction studies have clearly shown that a significant proportion of fcc grains are induced when a high base pressure is allowed to remain in the chamber and this is consistent with the presence of residual nitrogen gas in the system.
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Gao et al. (1998) studied this question.
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