An analysis of the dynamic dielectric and electro-optic relaxation response of thin-film ferroelectrics is presented. The analysis is based upon the relaxation of ferroelectric domains with a continuous distribution of sizes given by percolation theory. The resulting temporal response is described by the expression Φ(t)∝t^-mexp[-(t/τ)^β]. The analysis was applied to KNbO₃ thin films. Measurements of the polarization, birefringence, and dielectric transients show qualitative agreement with the model over 11 orders of magnitude in time.
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Hoerman et al. (2002) studied this question.
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