A method of obtaining pairs of interferograms is described which makes possible the accurate and rapid evaluation of the optical path variations in the system tested. Such a pair of two-beam interferograms may be measured by displacement methods to an accuracy of about 0.002 wavelength if the path variations are small, or the pair may be viewed stereoscopically to give an impression of the path variation from point to point over the whole area.
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J.W.C. Gates (1954) studied this question.
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