Resonator power to frequency conversion in a cryogenic sapphire oscillator

We report on the measurement and characterization of power to frequency conversion in the resonant mode of a cryogenic sapphire loaded cavity resonator, which is used as the frequency discriminating element of a loop oscillator circuit. Fluctuations of power incident on the resonator lead to changes in radiation pressure and temperature in the sapphire dielectric, both of which contribute to a shift in the resonance frequency. We measure a modulation and temperature independent radiation pressure induced power to frequency sensitivity of −0.15 Hz/mW and find that this is the primary factor limiting the stability of the resonator frequency.