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Synopsis.---Theoretical expressions are derived giving the rate of escape of photo-electrons from the surface of a thin metallic film as a function of its thickness. These expressions result from various assumptions regarding the probability of escape of an electron photoelectrically excited at a given depth within the metal.The photoelectric currents from films of platinum and of gold of various thicknesses are measured for different wave-lengths of light, and the results are found to be consistent with the view that the average distance in any direction which an excited electron may move without losing its ability to escape is about 2.67 (10)^-7 cm. in platinum and 5.0 (10)^-7 cm. in gold, and that the probability of going a given distance without losing its ability to escape falls off exponentially with the distance. This average distance is shown to be independent of the initial kinetic energy of the electron. There is evidence that platinum is first deposited in a relatively unstable and electropositive state, and that it spontaneously changes into the ordinary stable form.A critical discussion and comparison of methods of measuring film thicknesses shows that they may be relied upon if proper precautions are taken. Various interesting properties of these thin films are illustrated and discussed.
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Compton et al. (1919) studied this question.
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