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December 24, 1979Physical Review Letters

Electronic Raman Scattering and Antiresonance Behavior in Highly Stressed Photoexcited Silicon

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DGDaniel GuidottiGeorgia Institute of TechnologySLShui T. LaiWorld VisionMKM. V. KleinNorthern Illinois University

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Guidotti et al. (1979) studied this question.

synapsesocial.com/papers/6a908158b71d06dae589ec4ahttps://doi.org/10.1103/physrevlett.43.1950
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