A novel mid‐infrared transmission imaging (MIR‐TI) technique for the nondestructive, optical inspection of yttria‐stabilized tetragonal zirconia polycrystal (Y–TZP) components is described. This technique was designed specifically for the detection of flaws and cracks within the bulk of the ceramic component. The MIR‐TI technique exploits a transparency window in Y–TZP from 3 to 7 μm; at shorter wavelengths the material is highly scattering, while at longer wavelengths it is absorbing. We demonstrate that using this technique it is possible to detect micrometer‐scale flaws at depths of up to 6 mm.
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Matysiak et al. (2009) studied this question.
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