TestingCPandCPTviolation in the neutral kaon system at a φ factory

A general discussion of the gamut of CP- and CPT-violation tests that can be performed at a high-luminosity {φ} factory is presented. The results of simulations of the expected time distribution patterns of events in such a {φ} factory are displayed. Furthermore, we demonstrate by means of a global fit to all distributions that, at a {φ} factory with a total integrated luminosity of 10⁴⁰ cm^-2, it is possible to determine most of the presently measured CP- and CPT-violating parameters in the neutral kaon system to a considerably better (statistical) level than that of current measurements. Present tests of CPT violation are examined and are contrasted with what could be achieved at such a {φ} factory. While present data could mask a potentially large CPT violation, measurements at a {φ} factory will be able to disentangle all the CPT-violating quantities from each other, allowing one to test unambiguously each CPT-violating parameter to one part in 10⁴ and, in particular, to measure the mass difference between the K⁰ and the K{} ⁰ to one part in 10¹⁸ of their mass.