Investigation of advanced position error signal patterns in patterned media

A potential approach to extending current thin film media to 100 Gbits/in2 recording density is physical patterning of the media, perhaps via an etching technique. An advantage of patterning is the capability of creating advanced position error signal (PES) patterns that are difficult or impossible to generate with writing by a recording head. This study uses spin stand tester to investigate various PES patterns generated by a focused ion beam etching technique on conventional thin film disks. For all practical purposes, the patterned PES eliminates transition noise, track edge noise, and erase band, therefore, demonstrates a much better PES signal than conventionally written servo patterns.