The unique potentialities and prospects for practical use of the X-ray scattering method as applied to the study and testing of surface roughnesses are considered. The high sensitivity, informative capability, and reliability of this method are demonstrated by using numerous examples. The results obtained by the X-ray scattering method at different wavelengths are compared with the available data of atomic-force microscopy.
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Асадчиков et al. (2003) studied this question.
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