A technique is described for calculating the roughness and probability density function of a surface based on the decorrelation of imaged speckle with wavelength. The decorrelation provides information about the first-order statistical properties of the imaged surface. Surfaces with rms roughnesses of greater than ~1 microm can be scanned over the 80-nm range of the dye-laser system.
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Schertler et al. (1993) studied this question.
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