We report an atomic hydrogen cleaning effect on surface oxide and contaminants on airexposed interfaces embedded in GaAs quantum well (QW) and InAs quantum dot (QD). A partly grown GaAs QW and a GaAs buffer layer for InAs QDs were air-exposed and hydrogen cleaned. After this procedure, we directly regrew a GaAs QW and InAs QDs as an active layer. Removal of surface oxide was monitored by reflection high-energy electron diffraction. The cleaned surface showed β(2×4) reconstruction. The photoluminescence properties of GaAs/AlGaAs QWs and InAs/GaAs QDs showed no degradation compared with those of the reference samples, even though the air-exposed interfaces were included in the active regions.
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Kim et al. (2003) studied this question.
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