In x-ray microanalysis allowance must be made not only for absorption of x-rays but also for the effects of penetration, diffusion and backscattering of the incident electrons. In view of the impossibility of pursuing separately every electron path, a simplified diffusion model is proposed and calculations based on this are compared with experiment. Agreement is in many cases good, but some discrepancies remain for future investigation.
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Archard et al. (1963) studied this question.
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