We report in situ transmission electron microscope dynamic observations of the growth of Cu₂O islands during oxidation of (001)Cu thin films at ~900 ^∘C, which show that the oxide islands have an initially square shape that transits to a terraced pyramid morphology as growth proceeds. The surface topology obtained from ex situ atomic force microscopy observation indicates that the terraced oxide pyramids have a hollow structure. A simple mechanical mechanism based on elastic-plastic deformation is proposed to explain the formation of this completely new oxide structure.
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Zhou et al. (2005) studied this question.
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