Near-field probes have been developed, based on standard, i.e., commercially available, Si cantilever probes for scanning force microscopy (SFM), which directly convert the optical near-field signal into an electrical signal using Schottky contacts. With these optoelectronic probes it is possible to realize very compact near-field microscopes. The probes are inserted into a SFM and measure the topography and the optical near-field signal simultaneously. The qualitative analysis of the light-sensitive areas of the probes and the detection of the optical near field is described. Finally, subwavelength resolution is demonstrated when a polished glass surface is investigated.
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Danzebrink et al. (1995) studied this question.