A sample of lightly doped p-type porous silicon has been investigated by small-angle x-ray scattering (SAXS) at two different wavelengths (0.154 and 0.071 nm) of the probing radiation. The scattering profiles are found to have distinctly different functionality, independently indicating the importance of accounting for multiple-scattering effects. The extracted single-scattering profile can be explained in terms of mixed cylindrical and spherical pores, without recourse to fractal structures.
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Mazumder et al. (1998) studied this question.
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