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January 1, 1985Advances in X-ray Analysis

Characterization of Epitaxial Films by X-Ray Diffraction

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ASArmin SegmüllerIBM Research - Thomas J. Watson Research Center

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Armin Segmüller (1985) studied this question.

synapsesocial.com/papers/6a9129f2a84e863524465780https://doi.org/10.1154/s0376030800010454
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