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A new optical storage medium is described which consists of a Ge film microscopically textured by reactive ion etching. The Ge surface, with a random array of decoupled columns of cross-sectional dimensions less than 100 nm, has a visible specular reflectance of less than 0.06. Reflective spots ∼1 μm in diameter have been produced on this surface by local heating with a low power laser beam. The fabrication, microstructure, and possibility of encapsulating the medium are discussed.
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Craighead et al. (1982) studied this question.
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