Raman microline focus spectrometry (MiFS) has been used to show that hydrogen containing amorphous carbon (a-C-H) films are readily annealed by a focused argon ion (514.5 nm) laser operating at a power typical of that used for conventional Raman microscopy. The annealing process produces microcrystallites of disordered graphite localized to a 2-μm-diam region within the laser spot focus. Annealing threshold power densities vary from film to film, but are of the order 1500 W mm−2.
No takes yet. Share an insight, caveat, or question.
Bowden et al. (1992) studied this question.
Synapse has enriched 5 related papers. Consider them for comparative context: