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Valency changeover in Sm layers on Si(111)7×7 studied with soft-x-ray-absorption spectroscopy Sakho, Oumar; Sacchi, Maurizio; Sirotti, Fausto; G. Rossi 1993 Abstract The valency changeover in Sm overlayers on Si(111)7Ã7 is probed with high accuracy using x-ray-absorption spectroscopy at the Sm M4,5 edges. The valency of Sm has been studied as a function of the layer thickness in the chemisorption regime, and compared with the results obtained for epitaxially grown samarium silicide layers.
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Sakho et al. (1993) studied this question.
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