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May 3, 1999Applied Physics Letters

Structural characterization of the low-temperature phase in Sr–Bi–Ta–O films

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JLJeong Soo LeeGeorgia Institute of TechnologyHKHyun Ja KwonYJYoung Woo JeongKorea Institute of Science and Technology

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Lee et al. (1999) studied this question.

synapsesocial.com/papers/6a917b539ea92d4f71f08730https://doi.org/10.1063/1.123938
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  1. 1Nonferroelectric epitaxial Sr–Bi–Ta oxide thin film with a high dielectric constant1998 · 27 citations
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