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The hydrogen atoms in the silicate Na20. SiO2.6H20 were located using neutron diffraction. The Si-O and Na-O bond lengths obtained from the refinement are compared with those given in the original X-ray structure determination, and also with the results of a completely new X-ray structure determination performed utilizing a chip from the crystal used for neutron diffraction. Some comments are made on the accuracy of the various results.
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Williams et al. (1971) studied this question.
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