Measurement of Dielectric Parameters of Small Samples at X-Band Frequencies by Cavity Perturbation Technique

The cavity perturbation method has been used to measure the permittivity of various dielectric materials such as Teflon, alumina, silica fiber, single crystal potassium chloride, bakelite, and p-type silicon at X-band frequencies. Normally, the samples required for measurements in a rectangular cavity are in the form of thin slabs/rods of height at least equal to the height of the cavity. When available samples are smaller (smaller than the height of the cavity), accurate measurements are often difficult. In this paper, an easy and reliable method is discussed for accurate determination of the properties of small-sized samples.