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The escape length of the photoelectrons in PbTe films was determined by measuring the quantum yield as a function of film thickness. The data indicate that the escape length of the electrons excited by photons of energies 7.7–11 eV is approximately 20–40 Å. The results are shown to be useful in estimating the mean free path for electron-electron scattering in PbTe.
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W. Pong (1972) studied this question.
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