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The influence of doping on the process of charge injection from a metal electrode into a model organic semiconductor is investigated. The contact resistance, which is the relevant figure-of-merit, is found to decrease dramatically upon doping beyond what is expected from theory and seen in crystalline semiconductors. This phenomenon is understood in terms of broadening of the transport manifold in the organic semiconductor, induced by the dopants.
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Hosseini et al. (2004) studied this question.
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