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Thin film bilayers of deuterated polystyrene (dPS) and blends of deuterated poly(methyl methacrylate) (dPMMA) with a compositionally symmetric random copolymer of styrene and methyl methacrylate (P[S 0.49 - ran -MMA]) were investigated by neutron reflectivity. Copolymer segregation to the free surface occurs upon spin-coating blends onto silicon substrates. Annealing the bilayers to equilibrium at 150 °C increases the segregation of the copolymer from the blend layers to the interface with dPS. Blends containing 5 and 10 vol % copolymer both exhibit this segregation behavior. For these blend compositions the interfacial segregation of copolymer from the miscible blends is insufficient to form a discrete layer. These results suggest that this random copolymer would be an interfacial specific additive.
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Pellegrini et al. (1997) studied this question.
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