Herein is reported a review and extension of recently published methods of correction for imperfect resolution (inadequate peak separation and or excessive peak broadening) for the SEC of linear homo and uniform copolymers and complex polymers such as polymers with long chain branching and nonuniform copolymers. Emphasis Is placed on analytical correction methods and absolute detector systems such as the low angle laser light scattering photometer and viscometer in series with a mass detector. Analytical correction methods and absolute detector systems play a vital role in the SEC characterization of complex polymers.
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A. E. Hamielec (1980) studied this question.
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