This paper gives a description of the determination of the average short—range order at the surface of an amorphous material and presents in detail accurate measuring procedures for scattered electron intensities, methods for data analysis, and corrections to the calculation of radial distribution function. A comparison of the surface r.d.f. determined by electron diffraction to the bulk r.d.f. investigated by X-ray diffraction of vitreous silica gives accurate informations about the surface structures. The vitreous silica surfaces consist of SiO4/2-tetrahedra both with strained siloxan bonds and with nonbridging oxygens.
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Rudakoff et al. (1986) studied this question.
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