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In this letter, a direct measurement of “easy” magnetization switching indicating zero-magnetization remanence in a magnetic probe with a cross section as narrow as 60×60 nm2, and as tall as 750 nm, is presented. Magnetic force microscopy was utilized to test focused-ion-beam-fabricated nanomagnetic probes. The data directly indicate that unlike a regular solid probe, a probe with a tubelike ending (nanotube) provides substantially “easier” switching.
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Khizroev et al. (2002) studied this question.
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