The reflectance spectra from six GaAs/AlAs multiple-quantum-well structures have been analyzed with a multilayer classical dielectric function model which describes in detail the propagation of light through these microstructures. The model predicts accurately the observed line shapes. It can be used for the analysis of the reflectance or transmission spectra of any semiconductor multilayer structure.
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Terzis et al. (1990) studied this question.
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