This paper describes a procedure for the characterization of defects inside dielectric materials. This nondestructive technique is supported by the development of a system that operates at 35 GHz. The reconstruction of the defect profile is performed by considering that the measured data are the result of a convolution of the true data with a point‐spread function (PSF).
No takes yet. Share an insight, caveat, or question.
Maazi et al. (2004) studied this question.
Synapse has enriched 5 related papers. Consider them for comparative context: