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The optical constants of Pt, Ag, and Cu in the soft X-ray region (100-1200 eV) derived from the reflectance method are reported. Samples were thickly deposited on substrates so that interference effects would be negligible. Using Debye-Waller and constant factors we could explain the angular dependence of the specular reflection of the soft X-rays from conventionally-evaporated mirrors.
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Yanagihara et al. (1988) studied this question.
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