In this presentation the influence of degradation of discharging dielectric on phase-resolved patterns of partial discharges (PD) is studied. Using conventional PD detection and statistical analysis, internal discharges in a flat cavity, and in epoxy insulation of two HV components were analyzed during long term tests. The results indicate that aging progress was accompanied by few consecutive changes in the phase-resolved patterns. This observation might become important for two applications: the developing of databases of different discharging defects, and the analysis of discharge degradation of dielectrics.>
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Gulski et al. (1995) studied this question.
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