The spatial variation of current density in lines with model void defects fabricated using focused-ion beam milling has been imaged using magnetic force microscopy (MFM). At current densities of 3–4×106 A/cm2, an asymmetry in the MFM signal is clearly visible at (1×1) μm2 and (0.5×0.5) μm2 notches at the edge of a 10 μm wide line. Comparison to a simple model calculation suggests that the asymmetry is due to current crowding, with the displaced current 70% localized to within 1μm of the notch.
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Yongsunthon et al. (2001) studied this question.
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