Photon spectra in various60Co irradiation cells are compared, and the filtering effects of shielding materials on the spectra are examined. The impact of scattered60Co photons on radiation testing of electronic devices is discussed, along with the resulting dose enhancement factors for Au-metallized devices. Standard dosimetry techniques are shown to be in significant error. Fluorescent x-ray yields from lead slabs irradiated by scattered and direct60Co photons are calculated, and their impact on device testing is estimated.
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Woolf et al. (1983) studied this question.
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