Ellipsometry on Anisotropic Langmuir‐Blodgett Films

This is the authors' abstract. We don't add key points for this paper.

Multiple angle null ellipsometry has been used to obtain information about the optical anisotropy of multilayer Langmuir‐Blodgett films. The data are evaluated with a simplified uniaxial (or biaxial) model system. The optical constants of films made of 22‐tricosenoic acid have been determined to nx,y = 1.51 and nz = 1.54 with a monolayer thickness of 3.2 nm. The data are compared with results from waveguide mode spectroscopy. Phenylhydrazone films have been measured in the spectral region between 420 nm (λmax) and 700 nm. The resulting data imply a tilt of the chromophore dipole direction greater than 45° with respect to the surface normal.