The capacitance-voltage (C-V) technique is proposed as a method for characterization of the electrical properties of alternating-current thin-film electroluminescent (ACTFEL) display devices. Analysis of the C-V and aging characteristics of ZnS:Mn ACTFEL devices indicates that the C-V technique is complementary to the charge-voltage technique in the extraction of device physics information.
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McArthur et al. (1990) studied this question.
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