Short pulse excitation is investigated of SnOxZnSCuxJZnS(Mn)Al electroluminescent thin film structures. The phenomenon of time delay of the electroluminescence maximum is observed. A model of the growth and decay of the electroluminescence curve is proposed on the assumption that energy transfer takes place from Cu centres to Mn centres. Good agreement between the theoretical and experimental curves is obtained. The three parameters used in the fitting, the lifetimes of the sensitizer and activator and the electroluminescence maximum delay time are in good agreement with the experimental results and the literature data.
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Chimczak et al. (1984) studied this question.