A new scanning tunneling microscope (STM) system is described that has been operated in several environments for both topographic imaging and tunnel spectroscopy. This STM shows high resistance to the effects of vibration and thermal drift. The device is unique in its simplicity and has only four moving parts. In addition, the critical tip–sample approach mechanism is inherently reliable and precise. The STM system accommodates a wide range of sample geometries and requires no special sample holder.
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Kaiser et al. (1988) studied this question.
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