Transverse electron focusing (TEF) of electron-like and hole-like orbits has been observed in zinc single crystals and used to investigate the probability (p) of specular reflection of conduction electrons at sample surfaces. The measured value of p ranges from 0.0+or-0.1 to 0.61+or-0.02 depending on both crystallographic planes and kinds of orbit. For the third-zone lens-orbit signals, the amplitude ratio between the two different geometries and the angular dependence of the focusing field are analysed on the basis of a simple geometric model of electron focusing (GMEF). The effect of surface treatment has also been tested.
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Sato et al. (1984) studied this question.
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