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The optical band edge of reactively sputtered CuxS films has been determined to be 1.18±0.03 eV using a technique in which the conductance of the films with respect to the wavelength of the incident light was measured. These results were found to confirm optical absorption data on CuxS films. Also, the efficiency of a 6.0% solar cell which was made using this sputtering technique is reported.
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McLeod et al. (1984) studied this question.
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