Measurement of inelastic/elastic scattering ratio for fast electrons and its use in the study of radiation damage

The ratio n of cross-sections for inelastic and elastic scattering of 80 keV electrons is measured for thin solid films of the elements Be, C, Al, As, and Sn. The values obtained are in reasonable agreement with theoretical predictions of Lenz and Burge and Smith. Measurements of n are also made for diphenyl anthracene as a function of electron exposure; the method is discussed as a means of monitoring ionization damage in organic compounds.