Reaching high-resolution imaging of delicate samples at a low-intensity level is a major challenge in microscopy. Here, we present and experimentally implement an advanced quantum super-resolution imaging technique based on photon statistics measurement. Our reconstruction algorithm adapts to any kind of non-Poissonian emitters, outperforming the corresponding classical SOFI method, in particular in low-light conditions. It offers sub-diffraction resolution improvement that scales with the j , where j is the highest-order central moments of the photocounts. More remarkably, we show that in combination with structured illumination, an improvement of j + j can be reached, providing a promising avenue for non-invasive super-resolution microscopy.
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Picariello et al. (2025) studied this question.
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